Produktdetaljer
ISBN
9781461357629
Publisert
2012-10-21
Utgiver
Vendor
Springer-Verlag New York Inc.
Høyde
229 mm
Bredde
152 mm
Aldersnivå
Research, P, 06
Språk
Product language
Engelsk
Format
Product format
Heftet
Redaktør
In 1992 Acoustic Microscopy was published by Oxford University Press, in the series of Monographs on the Physics and Chemistry of Materials. Reviews appeared in the Journal of Microscopy [169 (1), 91] and in Contemporary Physics [33 (4), 296]. At the time of going to press, it seemed that the field of acoustic microscopy had settled down from the wonderful developments in resolution that had been seen in the late seventies and the early eighties and from the no less exciting developments in quantitative elastic measurements that had followed. One reviewer wrote, "The time is ripe for such a book, now that the expansion of the subject has perceptively slowed after it was detonated by Lemons and Quate. " [A. Howie, Proc. RMS 27 (4), 280]. In many ways, this remains true. The basic design for both imaging and quantitative instruments is well-established; the upper frequency for routine imaging is the 2 GHz established by the Ernst Leitz scanning acoustic microscope (ELSAM) in 1984. For the most accurate V(z) measurements, the 225-MHz line-focus-beam lens, developed at Tohoku Univer sity a little before then, remains standard. The principles of the contrast theory have been confirmed by abundant experience; in particular the role of surface acoustic waves, such as Rayleigh waves, dominates the contrast in most high resolution studies of many materials.
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In 1992 Acoustic Microscopy was published by Oxford University Press, in the series of Monographs on the Physics and Chemistry of Materials.
1. Acoustic Microscopy Analysis of Microelectronic Interconnection and Packaging Technologies.- 1.1. Introduction.- 1.2. Ceramic Packages.- 1.3. Plastic IC Packages.- 1.4. Die Attach.- 1.5. Multilayer Interconnect.- 1.6. Tape Automated Bonding.- 1.7. Mechanical Properties.- 1.8. Future Perspectives.- 1.9. Conclusions.- Acknowledgments.- References.- 2. Measuring Short Cracks by Time-Resolved Acoustic Microscopy.- 2.1. Introduction.- 2.2. Short-Pulse System for the SAM.- 2.3. Time-Resolved Measurement Technique.- 2.4. Crack Depth Measurements in Plastic Material.- 2.5. Applying TOFD to Metals.- 2.6. Crack Growth Measurement.- 2.7. Discussion.- 2.8. Summary.- Acknowledgments.- References.- 3. Probing Biological Cells and Tissues with Acoustic Microscopy.- 3.1. Introduction.- 3.2. Probing Cells in Culture.- 3.3. Probing Microspheres and Freshly Isolated Outer Hair Cells.- 3.4. Bone and Other Collagenous Tissues.- 3.5. Model Investigations of Gels and Membranes.- 3.6. Conclusions.- Acknowledgments.- References.- 4. Lens Geometries for Quantitative Acoustic Microscopy.- 4.1. Introduction.- 4.2. Acoustic Lens Geometries.- 4.3. Comparison of Signal Processing Electronics.- 4.4. The V(f) Characterization Method.- 4.5. Accuracy of Velocity Measurement Using the V(z) Method..- 4.6. Conclusions.- Acknowledgments.- References.- 5. Measuring Thin-Film Elastic Constants by Line-Focus Acoustic Microscopy.- 5.1. Overview.- 5.2. Introduction.- 5.3. Measurement Model for V(z) Curves.- 5.4. Measuring and Calculating SAW Velocities.- 5.5. Inverse Method.- 5.6. Elastic Constants of Single-Layer Films.- 5.7. Effective Elastic Constants of Superlattices.- 5.8. Conclusion.- Acknowledgment.- References.- 6. Measuring the Elastic Properties of Stressed Materials by Quantitative Acoustic Microscopy.- 6.1. Introduction.- 6.2. Acoustoelasticity and Surface Waves.- 6.3. Line-Focus Beam Acoustic Microscopy.- 6.4. Determining Materials Properties.- 6.5. Examples.- 6.6. Conclusions.- Acknowledgments.- References.- 7. Surface Brillouin Scattering—Extending Surface Wave Measurements to 20 GHz.- 7.1. Introduction.- 7.2. Kinematics of Brillouin Scattering.- 7.3. Theory of Brillouin-Scattering Cross Section.- 7.4. Surface Brillouin Scattering Setup.- 7.5. Experimental Results.- 7.6. Conclusions.- Acknowledgments.- References.- 8. New Approaches in Acoustic Microscopy for Noncontact.- Measurement and Ultrahigh Resolution.- 8.1. Introduction.- 8.2. Phase Velocity Scanning Method.- 8.3. Atomic Force Microscopy (AFM) with a Vibrating Sample.- Acknowledgement.- References.
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Springer Book Archives
Springer Book Archives
Produktdetaljer
ISBN
9781461357629
Publisert
2012-10-21
Utgiver
Vendor
Springer-Verlag New York Inc.
Høyde
229 mm
Bredde
152 mm
Aldersnivå
Research, P, 06
Språk
Product language
Engelsk
Format
Product format
Heftet
Redaktør