Now in its second edition, this continues to serve as an ideal
textbook for introductory courses on materials characterization, based
on the author's experience in teaching advanced undergraduate and
postgraduate university students.
The new edition retains the successful didactical concept of
introductions at the beginning of chapters, exercise questions and an
online solution manual. In addition, all the sections have been
thoroughly revised, updated and expanded, with two major new topics
(electron backscattering diffraction and environmental scanning
electron microscopy), as well as fifty additional questions - in total
about 20% new content.
The first part covers commonly used methods for microstructure
analysis, including light microscopy, X-ray diffraction, transmission
and scanning electron microscopy, as well as scanning probe
microscopy. The second part of the book is concerned with techniques
for chemical analysis and introduces X-ray energy dispersive
spectroscopy, fluorescence X-ray spectroscopy and such popular surface
analysis techniques as photoelectron and secondary ion mass
spectroscopy. This section concludes with the two most important
vibrational spectroscopies (infra-red and Raman) and the increasingly
important thermal analysis.
The theoretical concepts are discussed with a minimal involvement of
mathematics and physics, and the technical aspects are presented with
the actual measurement practice in mind. Making for an easy-to-read
text, the book never loses sight of its intended audience.
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Produktdetaljer
ISBN
9783527670802
Publisert
2014
Utgave
2. utgave
Utgiver
Vendor
Wiley-VCH
Språk
Product language
Engelsk
Format
Product format
Digital bok
Forfatter