This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
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* Covers state-of-the-art techniques commonly used in modern materials characterization * Includes two important aspects of characterization - materials structures and chemical analysis * Provides practical guide for experiments * Is based on 10-year experience of a successful course .
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Part One: Microstructure Examinations. Light microscopy. X-ray diffraction methods. Transmission electron microscopy. Scanning electron microscopy. Scanning probe microscopy. Part Two: Chemical and Thermal Analysis. X-Ray Spectroscopy for Elemental Analysis. Electron Spectroscopy for Surface Analysis. Secondary Ion Mass Spectrometry for Surface Analysis. Vibrational Spectroscopy for Molecular Analysis. Thermal analysis.
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Produktdetaljer
ISBN
9780470823002
Publisert
2010-01-29
Utgiver
Vendor
Wiley-Blackwell
Vekt
1000 gr
Høyde
250 mm
Bredde
150 mm
Dybde
15 mm
Aldersnivå
P, 06
Språk
Product language
Engelsk
Format
Product format
Annet format
Antall sider
352
Forfatter