This special edition analyses recent technological advances, modern design methodologies, and performance evaluation and parameters optimisation techniques of SiC-based power devices.
Special topic volume with invited peer-reviewed papers only
- Preface
- Design Parameters Impact on Electrical Characteristics of 4H-SiC Thyristors with Etched Junction Termination Extension
- SiC MOSFETs C-V Capacitance Curves with Negative Biased Drain
- TCAD Modelling of Anisotropic Channel Mobility in 4H-SiC MOSFETs
- On the Characterization of 4H-SiC PiN Diodes and JFETs for their Use in High-Voltage Bidirectional Power Devices
- The 3rd Quadrant Operation of 4th Generation SiC MOSFETs: Recovery Charge & Bipolar Degradation
- Optimizing 1.2 kV SiC Trench MOSFETs for Enhanced Performance and Manufacturing Efficiency
- Novel SiC MOSFET Edge-Termination Structure for Electric Field Relaxation Using an Oxide Film along the Trench Surface
- SiC Schottky-Barrier Diode without Ion-Implanted P-Type Regions
- Three Level Pulses to Investigate Gate Switching Instability
- DFT Calculations on the Termination of 4H-SiC Non-Polar Surfaces during Photoelectrochemical Pore Formation
- TCAD Model Parameter Calibration Strategy for 1200V SiC MOSFET
- Lifetime Modeling of MOS Based SiC Vertical Power Devices under High Voltage Blocking Stress
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Produktdetaljer
ISBN
9783036409146
Publisert
2025-09-17
Utgiver
Trans Tech Publications Ltd
Vekt
320 gr
Høyde
240 mm
Bredde
170 mm
Dybde
5 mm
Aldersnivå
P, 06
Språk
Product language
Engelsk
Format
Product format
Heftet
Antall sider
100