This special edition analyses recent technological advances, modern design methodologies, and performance evaluation and parameters optimisation techniques of SiC-based power devices.

Special topic volume with invited peer-reviewed papers only

  • Preface
  • Design Parameters Impact on Electrical Characteristics of 4H-SiC Thyristors with Etched Junction Termination Extension
  • SiC MOSFETs C-V Capacitance Curves with Negative Biased Drain
  • TCAD Modelling of Anisotropic Channel Mobility in 4H-SiC MOSFETs
  • On the Characterization of 4H-SiC PiN Diodes and JFETs for their Use in High-Voltage Bidirectional Power Devices
  • The 3rd Quadrant Operation of 4th Generation SiC MOSFETs: Recovery Charge & Bipolar Degradation
  • Optimizing 1.2 kV SiC Trench MOSFETs for Enhanced Performance and Manufacturing Efficiency
  • Novel SiC MOSFET Edge-Termination Structure for Electric Field Relaxation Using an Oxide Film along the Trench Surface
  • SiC Schottky-Barrier Diode without Ion-Implanted P-Type Regions
  • Three Level Pulses to Investigate Gate Switching Instability
  • DFT Calculations on the Termination of 4H-SiC Non-Polar Surfaces during Photoelectrochemical Pore Formation
  • TCAD Model Parameter Calibration Strategy for 1200V SiC MOSFET
  • Lifetime Modeling of MOS Based SiC Vertical Power Devices under High Voltage Blocking Stress
Les mer

Produktdetaljer

ISBN
9783036409146
Publisert
2025-09-17
Utgiver
Trans Tech Publications Ltd
Vekt
320 gr
Høyde
240 mm
Bredde
170 mm
Dybde
5 mm
Aldersnivå
P, 06
Språk
Product language
Engelsk
Format
Product format
Heftet
Antall sider
100